High quality tool for professionals ! Using the 4-point probe method, this device ensures precise measurement of the sheet resistance of metallic thin film as well as semiconductor materials like a solar battery silicon with easy & simple operation.

<Applications> For the following product inspections

1) Processes from silicon to wafer manufacturing

2) Liquid crystal panels (LCD) manufacturing

3) Manufacturing process of wide range of electric conductivity elements.

    Optional 4-Point Probe is needed for the measurement.